| Simulation Software for Advanced Lithography |
| Panoramic Technology Products |
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New Demo Videos
Gazillion is a layout editor/viewer/simulator
- import layout from GDS-II or from .dsa/.dscript file
- export subsections of the layout as polygons or as pixel-mapped topography to create 2D and 3D mask geometry
- export to GDS-II
- view a multi-layer mask layout
- clear, crop, cut, copy paste layout
- run mask/aerial/resist simulations right from the layout, import simulation results into the layout as layers
- run OPC correction (requires PanOPC option)
- set run-time measurements right on the layout, export measurements to "Run-Time" measurements in Aerial and Resist
- view GDS-II hierarchy, select sub-structures
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| PanOPC (EM-Suite Option)
- Apply Model-Based Optical Proximity Correction algorithms to imported GDS-II layouts
- Export corrected layout (back to GDS-II, correctly inserted into hierarchy)
- Uses EM-Suite as the "in-line" simulator (rigorous or scalar, aerial image or resist image)
- Set up OPC parameters as variables - tune the OPC algorithms to particular layouts
- Suitable for small areas (NOT full chip yet!)
- Tiling and stitching for larger areas - works with SimRunner
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| Topography Editor (EM-Suite Core)
- Edit 2D complex transmission function ("thin" mask)
- Edit 3D topography ("thick" mask)
- Build topography from "blocks"
- Ability to set all topographical parameters as variables
- Import GDS-II, surfaces, and 3D bit-maps
- Front end to rigorous topography simulators (TEMPESTpr2, TEMPESTpr1, WASP) and scalar topography simulator (Stack/Kirchhoff)
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| Aerial Imaging (EM-Suite Core)
- Full-vector aerial imaging
- Complete control over polarization
- Image into air, immersion liquid or film stack
- Predefined or user-customizable illuminations
- "Flashlight" feature lets user see effects of individual source integration points
- All imaging parameters can be set as variables
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| Resist (EM-Suite Option)
- Solves 3D diffusion-reaction and develop equation
- Output resist profiles, acid & base concentrations, de-protection levels
- Add temperature dependence, user-defined PEB temperature profiles
- All resist parameters can be set as variables
- Unencrypted resist parameter sets from other commercial simulators can be easily converted
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| Visual/Metrology (EM-Suite Core)
- Plot and measure 1D, 2D and 3D data
- Matrix plot
- measure CD, ILS, contrast, resist height etc.
- Generate Bossung curves, process windows (rectangular, elliptical) and Exposure Latitude vs. DOF curves
- Powerful Data post-processing with Data Series Calculator
- Import and export text
- Apply polynomial curve fit to noisy, off-grid data (useful form importing measured CD FEM data)
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- scalar ("thin") mask model
| TEMPESTpr2 (EM-Suite Option)
- 3D rigorous FDTD solution to the Maxwell equations
- Periodic boundary conditions in X & Y, isolated in Z
- Continuous angle of incidence allowed
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SOAPI (EM-Suite Option)
- Scripting and Open API
- Interface EM-Suite simulators with your own code
- API gives access to simulators and metrology and plotting subroutines
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- Distribute runs across computers on the network
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WASP (EM-Suite Option)
- 30X to 40X faster than TEMPESTpr2!!! Suitable for ArF phase shift masks lithography applications (CPL, Alt. PSM, Att. PSM etc.)
- Excellent for small area rigorous model-based OPC with PanOPC
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- Stand alone film-stack analysis
- Convert 3D "thick" topographies to 2D "thin" complex transmission (then simulate with Kirchhoff)
- Library of material indices or refraction through wavelength
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